rc2004_04.djvu Journals Remont_and_service 2004 - Service manuals, schematics, documentation, applications, datasheets, electronics
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DASC approves low power format PAR
In the latest turn of the dispute for the keadership to define a Low Power Format standard, the IEEE structure has approved the creation of a Project Authorization request and announced a revision of its patent protection policies. Details... more...
Sematech uses X-ray to explore materials
Bede X-ray Metrology, a provider of X-ray metrology systems to the semiconductor industry, said that Sematech is accelerating the commercialization of its technology. Details... more...
Avatar experts pursued in NSF research effort
The National Science Foundation is funding development of electronic visualization technology, providing $500,000 in seed money to two university research teams. Details... more...