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Nanoscale chip verification: a massively analog problem?
As semicon
5b4
ductor manufacturing technology deals increasingly with finer and finer measurements, verification of nanoscale components presents a problem of scale, requiring a scaling of verification technology commensurate with the shrinking of technologies like CMOS. Details... more...
EEPROM - configurable system monitors voltages, current in complex systems
Maxim Integrated Products has introduced the MAX16031/MAX16032, EEPROM-based system monitors with non-volatile fault memory. Details... more...