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Broadband illumination captures critical defects
This article demonstrates that a tunable broadband brightfield approach has several advantages over a single-wavelength approach for meeting new inspection challenges and generating higher capture rates of yield-impacting defects. Details... more...
Simplify DDR validation with SI methods
As DDR memory technology evolves, DDR signal integrity becomes more challenging—hence, it is essential to use a proper probing method to obtain the best result. Details... more...
Avoid design snags with silicon contour predictor
Designers can improve parametric yield and chip performance by accurately determining the impact of systematic variations during design. Details... more...