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Parametric probe cards cut testing costs at 45nm, beyond
Parametric probe cards cut testing costs at 45nm, beyond
Cascade Microtech has introduced two new Pyramid parametric probe cards that allow single-pass high-performance DC and RF measurements and reduce the cost of parametric production test for semiconductors at 65nm, 45nm and beyond.
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2008-02-05 00:00:00
 
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